Keithleys ACS integrated test systems help semiconductor manufacturing

Instruments of measurement needs solutions companies Keithley (Keithley), recently released ACS (Automated Characterization Suite) Automated Characterization Suite integrated test systems. The test ADS7831U system at the device, wafer-level and black box level semiconductor characterization analysis. ACS test system through a unified software suite, providing faster measurement speed and greater system flexibility to meet the users unique test application needs. Unified Automated Characterization Suite, Keithleys ACS integrated test systems integrate a variety of test hardware, comprehensive and unique IR2132S measurement capabilities: Keithleys powerful Model 4200-SCS Semiconductor Characterization System IV source-measure capabilities and professional pulse test kit, for example, testing of advanced semiconductor materials 4200-PIV toolkit. Series 2600 System SourceMeter tester with TSP-Link MAX125CEAX+T and Test Script Processor (TSP), scalable IV channel system, high-speed NBTI testing, or wafer level device characterization and other applications in the operating conditions for parallel measurement and the complexity of the test sequence. Series 2400 SourceMeter tester can provide high voltage and high current source, can be used for high power MOSFETs and display drive testing. In addition, ACS integrated test systems also provide users with the choice of switch, C table, CS5532-ASZ and the pulse generator and other accessories. ACS integrated test systems have two types of configurations: basic desktop configuration, and for the production environment integrated full height rack configurations. Source: Electronic Engineering Times